专利名称：System and method for calibrating position
of microscope slide within storagereceptacle
发明人：Patrick Guiney,Scott Wolpert申请号：US10998028申请日：20041124公开号：US07140738B2公开日：20061128
专利附图：
摘要：System and method for calibrating the orientation or arrangement of slides in astorage receptacle. A reflective marking is asymmetrically applied to a side or edge of a
slide, forming reflective and non-reflective sections. Light is directed to the slide, and asensor detects light that is reflected by the reflective sections and generates signal ordata representing an orientation of the slide. A controller processes the signal or data todetermine whether the slide is properly oriented on a tray in the storage receptacle, e.g.,whether the slide is flat or at an angle, upside down, rotated. The marking can bereflective ink, paint or an adhesive. Reflective and non-reflective markings can also beformed by laser etching, polishing, or by frosting.
申请人：Patrick Guiney,Scott Wolpert
地址：Concord MA US,Westford MA US
国籍：US,US
代理机构：Vista IP Law Group LLP
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