专利名称：Quality control and support method for
analyzer
发明人：Ken'ichi Okuno,Hiroyuki Morihara,Tadayuki
Yamaguchi,Tomomi Sugiyama
申请号：US10620358申请日：20030717公开号：US06937964B2公开日：20050830
专利附图：
摘要：The present invention quickly resolves troubles in an analyzer and performseffective external quality control management. An analyzer () and a control device () are
connected by a network (). Error data and sample data taken from assay of a qualitycontrol substance are transmitted from the control device () to the analyzer (). Theanalyzer () is made to be remotely operable from the control device () and when troublesarise repair from the control device () is possible. The control device () tallies sampledata, and provides the tally results to a Web page. The analyzer () accesses the Webpage using a WWW browser, and can perform external quality control in real time.
申请人：Ken'ichi Okuno,Hiroyuki Morihara,Tadayuki Yamaguchi,Tomomi Sugiyama
地址：Kakogawa JP,Kobe JP,Kobe JP,Kobe JP
国籍：JP,JP,JP,JP
代理机构：Shinjyu Global IP Counselors, LLP
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