专利名称：Three-dimensional measurement system
with projection device
发明人：Kochi, Nobuo,Yamada, Mitsuharu,Watanabe,
Hiroto,Moriyama, Takuya
申请号：EP06020585.3申请日：20060929公开号：EP1770356A2公开日：20070404
专利附图：
摘要：The object of the invention is to improve the efficiency of and promote theautomation of non-contact three-dimensional measurement over a wide area utilizing a
projection device for projecting a target pattern. A projection device for three-dimensional measurement 80 according to the invention includes: a projection section 12for projecting onto the shape of a measuring object a measurement pattern P indicatingmeasurement points Q; a pattern projection control section 493 for controlling theprojection section 12 to project the measurement pattern P; a pattern detection section491 for detecting the measurement points Q from a photographed image of themeasurement pattern P projected by the projection section 12; and a pattern formingsection 492 for forming, based on displacement of the measurement points Q in a firstmeasurement pattern detected by the pattern detection section 491, a second
measurement pattern where the measurement points are increased, deleted or changed.
申请人：TOPCON CORPORATION
地址：No. 75-1, Hasunuma-cho, Itabashi-ku Tokyo 174-8580 JP
国籍：JP
代理机构：HOFFMANN EITLE
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