专利名称：Method for measuring the thickness of an
electro-plating layer on a polymer film
发明人：SCHMIDEGG, KLAUS, DR.,BERGSMANN,
MARTIN, DR.
申请号：EP07024702.8申请日：20071220公开号：EP1939584A2公开日：20080702
专利附图：
摘要：The method involves irradiating of an optically anisotropic polymer foil (2) onthe coated side with linear polarized light. The absorption of the relative difference of
the light reflection is determined by the metallization layer (1) at the upper surface ofthe polymer foil accommodating the metallization layer along two orthogonal polarizedaxes as measured for the thickness of the metallization layer.
申请人：HUECK FOLIEN GES.M.B.H.
地址：Gewerbepark 30 4342 Baumgartenberg AT
国籍：AT
代理机构：Landgraf, Elvira
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